1. osnaDocs
  2. Fachbereich 06 - Mathematik / Informatik / Physik
  3. FB06 - Hochschulschriften

Absorption and Remission Characterization of Pure, Dielectric (Nano-)Powders Using Diffuse Reflectance Spectroscopy

Bitte benutzen Sie diese Kennung, um auf die Ressource zu verweisen:
https://osnadocs.ub.uni-osnabrueck.de/handle/urn:nbn:de:gbv:700-202004202931
Open Access logo originally created by the Public Library of Science (PLoS)
Langanzeige der Metadaten
DC ElementWertSprache
dc.creatorBock, Sergej-
dc.creatorKijatkin, Christian-
dc.creatorBerben, Dirk-
dc.creatorImlau, Marco-
dc.date.accessioned2020-04-20T08:55:59Z-
dc.date.available2020-04-20T08:55:59Z-
dc.date.issued2019-11-16-
dc.identifier.citationApplied Sciences 2019, 9, 4933. Basel: MDPIger
dc.identifier.urihttps://osnadocs.ub.uni-osnabrueck.de/handle/urn:nbn:de:gbv:700-202004202931-
dc.description.abstractThis paper addresses the challenging task of optical characterization of pure, dielectric (nano-)powders with the aim to provide an end-to-end instruction from appropriate sample preparation up to the determination of material remission and absorption spectra. We succeeded in establishing an innovative preparation procedure to reproducibly obtain powder pellet samples with an ideal Lambertian scattering behavior. As a result, a procedure based on diffuse reflectance spectroscopy was developed that allows for (i) performing reproducible and artifact-free, high-quality measurements as well as (ii) a thorough optical analysis using Monte Carlo and Mie scattering simulations yielding the absorption spectrum in the visible spectral range. The procedure is valid for the particular case of powders that can be compressed into thick, non-translucent pellets and neither requires embedding of the dielectric (nano-)powders within an appropriate host matrix for measurements nor the use of integrating spheres. The reduced spectroscopic procedure minimizes the large number of sources for errors, enables an in-depth understanding of non-avoidable artifacts and is of particular advantage in the field of material sciences, i.e., for getting first insights to the optical features of a newly synthesized, pure dielectric powder, but also as an inline inspection tool for massively parallelised material characterization.eng
dc.relationhttps://www.mdpi.com/2076-3417/9/22/4933ger
dc.rightsAttribution 4.0 International*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/*
dc.subjectdiffuse reflectance spectroscopyeng
dc.subjectintegration sphereeng
dc.subjectoptical materialseng
dc.subjectdielectric powder pelletseng
dc.subjectnanomaterialseng
dc.subjectTiO2und
dc.subjectYAG:Ce3+und
dc.subjecttroubleshoutingeng
dc.subjectsimulationeng
dc.subjectabsorption coefficienteng
dc.subject.ddc530 - Physikger
dc.titleAbsorption and Remission Characterization of Pure, Dielectric (Nano-)Powders Using Diffuse Reflectance Spectroscopyeng
dc.typeEinzelbeitrag in einer wissenschaftlichen Zeitschrift [article]ger
dc.identifier.doi10.3390/app9224933-
Enthalten in den Sammlungen:FB06 - Hochschulschriften
Open-Access-Publikationsfonds

Dateien zu dieser Ressource:
Datei Beschreibung GrößeFormat 
applsci-09-04933-v2_Bock.pdfJournal article10,9 MBAdobe PDF
applsci-09-04933-v2_Bock.pdf
Miniaturbild
Öffnen/Anzeigen
Zur Kurzanzeige


Diese Ressource wurde unter folgender Copyright-Bestimmung veröffentlicht: Lizenz von Creative Commons Creative Commons